SMOOTH SURFACE METALLOGRAPHY USING THE SCANNING ELECTRON MICROSCOPE.

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作者：
Hall, M.G.
Hutchinson, W.B.
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来源：
Metallurgist and materials technologist | 1980年 / 12卷 / 07期
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摘要：
This paper considers capabilities of the SEM that derive from its ability to examine flat polished specimens and complement the conventional optical microscope for metallographic examination.
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页码：371 / 375
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