SMOOTH SURFACE METALLOGRAPHY USING THE SCANNING ELECTRON MICROSCOPE.

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作者：

Hall, M.G.

Hutchinson, W.B.

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来源：

Metallurgist and materials technologist | 1980年 / 12卷 / 07期

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摘要：

This paper considers capabilities of the SEM that derive from its ability to examine flat polished specimens and complement the conventional optical microscope for metallographic examination.

引用

页码：371 / 375

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