Composition of (Bi2S3)1-x(CdS)x semiconductor thin films by proton induced X-ray emission and helium backscattering

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作者：
Misra, S. [1 ]
机构：
[1] G.M. Coll, Sambalpur, India
来源：
Diffusion and Defect Data Pt.B: Solid State Phenomena | 1997年 / 55卷
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页码：215 / 217
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