ACCELERATED LIFE TEST AND ANALYSIS OF CHARACTERISTIC DEGRADATION OF TANTALUM SOLID ELECTROLYTIC CAPACITORS.

ACCELERATED LIFE TEST DATA ON TANTALUM ELECTROLYTIC CAPACITORS ARE ANALYZED AND THE RESULTS OBTAINED ARE SUMMARIZED. THE SAMPLES (N = APPROXIMATELY 15-20) OF TWO DIFFERENT MANUFACTURERS A AND B ARE TESTED DURING 2 * 10**4 HOURS AT COMBINEDCONDITIONS OF 5 DIFFERENT AMBIENT TEMPERATURES (25, 55, 85,100 AND 125 D. C) AND 2 LEVELS OF APPLIED VOLTAGE (RATED AND 2 TIMES RATED VOLTAGE). THE DEGRADATION PATTERN OF CHARACTERISTIC PARAMETER X, AND THE CUMULATIVE DISTRIBUTION OF THE DEGRADATION LIFE TIME, WHICH IS DEFINED AS THE DURATION OF TIME WHEN X REACHES TO THE SPECIFIED VALUE, ARE GIVEN. IN JAPANESE WITH ENGLISH ABSTRACT.