Simple model for calculating proton induced SEU

被引:0
|
作者
Soreq NRC, Yavne, Israel [1 ]
机构
来源
IEEE Trans Nucl Sci | / 3 pt 1卷 / 979-984期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] SIMPLE-MODEL FOR PROTON-INDUCED LATCH-UP
    MCNULTY, PJ
    ABDELKADER, WG
    BEAUVAIS, WJ
    ADAMS, L
    DALY, EJ
    HARBOESORENSEN, R
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1993, 40 (06) : 1947 - 1951
  • [22] Simplified one parameter proton-induced SEU cross section dependence
    Chumakov, AI
    PROCEEDINGS OF THE 7TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2004, 536 : 415 - 418
  • [23] VARIATION IN PROTON-INDUCED UPSETS RATES FROM LARGE SOLAR-FLARES USING AN IMPROVED SEU MODEL
    NORMAND, E
    STAPOR, WJ
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) : 1947 - 1952
  • [24] Extension of a proton SEU cross section model to include 14 MeV neutrons
    Edmonds, Larry D.
    Irom, Farokh
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (01) : 649 - 655
  • [25] METHODS FOR CALCULATING SEU RATES FOR BIPOLAR AND NMOS CIRCUITS
    MCNULTY, PJ
    ABDELKADER, WG
    BISGROVE, JM
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) : 4180 - 4184
  • [26] A simple model for calculating atomic charges in molecules
    Voityuk, Alexander A.
    Stasyuk, Anton J.
    Vyboishchikov, Sergei F.
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2018, 20 (36) : 23328 - 23337
  • [27] Simple Mathematical Model for Calculating Regenerators.
    Schack, K.
    Gaswaerme International, 1974, 23 (04): : 133 - 138
  • [28] A SIMPLE ALGORITHM FOR PREDICTING PROTON SEU RATES IN-SPACE COMPARED TO THE RATES MEASURED ON THE CRRES SATELLITE
    REED, RA
    MCNULTY, PJ
    BEAUVAIS, WJ
    ABDELKADER, WG
    STASSINOPOULOS, EG
    BARTH, JCL
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2389 - 2395
  • [29] Proton and light ions induced SEU effect in a SOI SRAM with gold plated lid
    Gao, J.
    Zhang, Q.
    Li, B.
    Xi, K.
    Li, B.
    Liu, F.
    Wang, C.
    Liu, H.
    Zhao, F.
    Zeng, C.
    Luo, J.
    Han, Z.
    Liu, J.
    Guo, G.
    MICROELECTRONICS RELIABILITY, 2019, 100
  • [30] Simple mathematical model for calculating drawbead restraining force
    Li, Dayong, 2000, Chin Mech Eng Soc, Beijing (36):