Electron transport properties in a GaAs/AlGaAs quantum wire grown on V-grooved GaAs substrate by metalorganic vapor phase epitaxy

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机构
[1] Hahn, Cheol-Koo
[2] Sugaya, Takeyoshi
[3] 1,Jang, Kee-Youn
[4] Wang, Xue-Lun
[5] Ogura, Mutsuo
来源
Hahn, C.-K. (ck-han@aist.go.jp) | 1600年 / Japan Society of Applied Physics卷 / 42期
关键词
Coulomb blockade - Electric conductance - Electric currents - Electric resistance - Electron transport properties - Field effect transistors - Metallorganic vapor phase epitaxy - Semiconducting aluminum compounds - Semiconducting gallium arsenide - Semiconductor growth - Semiconductor quantum wells - Substrates;
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摘要
A series of nonlinear conductance phenomena is investigated in the GaAs V-grooved quantum wire (QWR) field effect transistors (FETs) prepared by the flow-rate modulated epitaxy (FME) technique. These are attributed to Coulomb blockade at a subthreshold gate bias, universal conductance steps near the threshold, real space transfer under a forward gate bias and a large source-drain bias condition. Weak carrier coupling between sidewall quantum wells and QWR is responsible for the small step height of the measured universal conductance (Gm G0 = 2e2/h). Shubnikov de Haas oscillation measurements revealed that sidewall quantum wells in the V-groove quantum wire act as additional current paths and are switched or mixed with QWR depending on the gate bias conditions and device geometry. The gate-bias-dependent current path switching is found to be responsible for the large current steps and negative differential resistance (NDR) in the drain current (IDS)-gate bias (VGS) and IDS-drain bias (VDS) relationships, respectively.
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