Reliability and availability analysis of a k-out-of-N:G redundant system with repair in the presence of chance of multiple critical errors

被引：0

作者：

Chung, Who Kee ^{[1
]}

机构：

[1] Univ of Ottawa, Ottawa, Canada

来源：

Microelectronics Reliability | 1994年 / 34卷 / 08期

关键词：

Availability - Critical errors - k-out-of-N:G redundant system;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：1337 / 1341

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