Hydrofluoric-treated GaAs surfaces analyzed by contact angle measurement and Auger electron spectroscopy

被引：0

作者：

Matsushita, Koichi ^{[1
]}

Suzuki, Naoki ^{[1
]}

Okuyama, Sumio ^{[1
]}

Kumagai, Yasuji ^{[1
]}

机构：

[1] Yamagata Univ, Yonezawa, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 10期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：5293 / 5296

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