共 50 条
- [42] Computer simulation of angle-resolved x-ray photoelectron spectroscopy measurements for the study of surface and interface roughnesses Journal of Applied Physics, 2006, 100 (10):
- [43] Atomic Force Microscopy and X-ray Photoelectron Spectroscopy Study on the Surface and Interface States of Liq and ITO Films NEW MATERIALS AND ADVANCED MATERIALS, PTS 1 AND 2, 2011, 152-153 : 566 - +
- [44] Excitation power dependent photoluminescence characterization of insulator-semiconductor interfaces on near surface quantum structures passivated by silicon interface control layer technology Applied Surface Science, 1997, 117-118 : 710 - 713
- [46] STUDY OF REVERSED ZONE MODIFICATIONS ON P-GAAS(CS,O) SURFACE AT ROOM-TEMPERATURE BY THE X-RAY PHOTOELECTRON-SPECTROSCOPY TECHNIQUE FIZIKA TVERDOGO TELA, 1995, 37 (02): : 344 - 350
- [47] Near-surface electronic structure in strained Ni-ferrite films: An x-ray absorption spectroscopy study JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2024, 42 (01):
- [49] Photoluminescence and X-ray photoelectron spectroscopic study of milled-ZnO material prepared by high energy ball milling technique SCIENCEASIA, 2020, 46 : 91 - 96