Red luminescence in phosphorous-doped chemically vapor deposited diamond

被引：0
|
作者：
机构：
来源：
J Appl Phys | / 1卷 / 419期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] FRACTURE-TOUGHNESS OF CHEMICALLY VAPOR-DEPOSITED DIAMOND
    DRORY, MD
    GARDINIER, CF
    SPECK, JS
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1991, 74 (12) : 3148 - 3150
  • [22] Highly Microcrystalline Phosphorous-Doped Si:H Very Thin Films Deposited by RF-PECVD
    Wilson, Alestair
    Fourmond, Erwann
    Saidi, Bilel
    Fornacciari, Benjamin
    Brottet, Solene
    Juhel, Marc
    Gros-Jean, Mickael
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2022, 219 (13):
  • [23] Raman Spectroscopic Study on Phosphorous-Doped Silicon Nanoparticles
    Momose, Miho
    Hirasaka, Masao
    Furukawa, Yukio
    APPLIED SPECTROSCOPY, 2015, 69 (07) : 877 - 882
  • [24] Topographical and structural investigations of phosphorous-doped silicon films
    Institute of Physics, University of Leoben, A-8700 Leoben, Austria
    不详
    Appl Phys A, SUPPL. 1 (S999-S1002):
  • [25] Superior photocatalytic properties of phosphorous-doped ZnO nanocombs
    Xie, Shufan
    Liu, Yangyang
    Chen, Zhenlu
    Chen, Xiaodong
    Wang, Xianying
    RSC ADVANCES, 2013, 3 (48) : 26080 - 26085
  • [26] Topographical and structural investigations of phosphorous-doped silicon films
    K. Sorschag
    H. Gold
    J. Lutz
    F. Kuchar
    M. Pippan
    H. Noll
    Applied Physics A, 1998, 66 : S999 - S1002
  • [27] Excimer laser crystallized phosphorous-doped polycrystalline silicon
    Saleh, R
    Nickel, NH
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2004, 338 : 143 - 146
  • [28] Structural and dielectric properties of phosphorous-doped PLZT ceramics
    Puja Goel
    Subhash Sharma
    Kanhaiya Lal Yadav
    Ajit Ram James
    Pramana, 2005, 65 : 1127 - 1132
  • [29] Structural and dielectric properties of phosphorous-doped PLZT ceramics
    Goel, P
    Sharma, S
    Yadav, KL
    James, AR
    PRAMANA-JOURNAL OF PHYSICS, 2005, 65 (06): : 1127 - 1132
  • [30] Topographical and structural investigations of phosphorous-doped silicon films
    Sorschag, K
    Gold, H
    Lutz, J
    Kuchar, F
    Pippan, M
    Noll, H
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S999 - S1002
12345