TETRODE FIELD EMISSION GUNS FOR ELECTRON MICROSCOPY.

被引：0
|
作者：
Roques, S.
Denizart, M.
Sonier, F.
机构：
来源：
Optik (Jena) | 1983年 / 64卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
9
引用
收藏
页码：51 / 66
相关论文
共 50 条
  • [41] QUANTITATIVE ANALYSIS OF MULTICOMPONENT AEROSOLS BY ELECTRON MICROSCOPY.
    Pashchenko, S.E.
    Kutsenogii, K.P.
    Lazareva, L.S.
    Baklanov, A.M.
    Pashchenko, A.E.
    Colloid Journal of the USSR (English Translation of Kolloidnyi Zhurnal), 1982, 44 (04): : 708 - 712
  • [42] FIELD-EMISSION GUN FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 523 - 524
  • [43] Field emission scanning electron microscopy of plant cells
    Vesk, M
    Dibbayawan, TP
    Vesk, PA
    Egan, EA
    PROTOPLASMA, 2000, 210 (3-4) : 138 - 155
  • [44] A Review Paper on "Graphene Field Emission for Electron Microscopy"
    Shao, Xiuyuan
    Khursheed, Anjam
    APPLIED SCIENCES-BASEL, 2018, 8 (06):
  • [45] Field emission scanning electron microscopy of plant cells
    Maret Vesk
    Teresa P. Dibbayawan
    Peter A. Vesk
    Elizabeth A. Egan
    Protoplasma, 2000, 210 : 138 - 155
  • [46] ANALYSIS OF THE ERRORS IN STEREOMEASUREMENTS IN SCANNING ELECTRON MICROSCOPY.
    Mel'nik, V.N.
    Sokolov, V.N.
    Shebatinov, M.P.
    Ivanchuk, O.M.
    Bulletin of the Academy of Sciences of the U.S.S.R. Physical series, 1986, 51 (03): : 48 - 53
  • [47] FIELD-EMISSION CANNON FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : A7 - A7
  • [48] FIELD EFFECTS ON CHEMISORBED FILMS IN ELECTRON EMISSION MICROSCOPY
    HILL, RJ
    JACOBS, PWM
    NATURE, 1959, 184 (4690) : 895 - 896
  • [49] FIELD-EMISSION GUN FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (03): : A13 - A13
  • [50] Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy
    Kirk, T. L.
    Scholder, O.
    De Pietro, L. G.
    Ramsperger, U.
    Pescia, D.
    APPLIED PHYSICS LETTERS, 2009, 94 (15)
12345