Interpretation Problems of Melts X-Ray Scattering Data.

被引：0
|
作者：
Hoyer, Walter
Thomas, Eberhard
Wobst, Manfred
机构：
来源：
Wissenschaftliche Zeitschrift - Technische Hochschule Karl-Marx-Stadt | 1979年 / 21卷 / 07期
关键词：
SPECTROSCOPY; X-RAY;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The scattering strength in wide- and narrow-angle regions of melted semiconductor alloys are discussed. The problem of standardization procedure is approached, along with methods for truncation error location and correction.
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页码：805 / 812
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