Methods for the prediction of total-dose effects on modern integrated semiconductor devices in space: A review

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Belyakov, V.V.
Pershenkov, V.S.
Zebrev, G.I.
Sogoyan, A.V.
Chumakov, A.I.
Nikiforov, A.Y.
Skorobogatov, P.K.
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Mikroelektronika | 2003年 / 32卷 / 01期
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页码：31 / 47
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