Methods for the prediction of total-dose effects on modern integrated semiconductor devices in space: A review

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Belyakov, V.V.

Pershenkov, V.S.

Zebrev, G.I.

Sogoyan, A.V.

Chumakov, A.I.

Nikiforov, A.Y.

Skorobogatov, P.K.

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Mikroelektronika | 2003年 / 32卷 / 01期

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页码：31 / 47

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