Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors

被引：0
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作者：
Zhou, C. [1 ]
Newns, D.M. [1 ]
机构：
[1] IBM T.J. Watson Research Cent, Yorktown Heights, United States
来源：
Journal of Engineering and Applied Science | 1998年 / 82卷 / 06期
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页码：3081 / 3088
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