Electrical characterization of InGaP/GaAs heterointerfaces grown by metallorganic chemical vapor deposition

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作者：
Nittono, Takumi [1 ]
Fukai, Yoshino K. [1 ]
Hyuga, Fumiaki [1 ]
Maeda, Narihiko [1 ]
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[1] NTT System Electronics Lab, Kanagawa, Japan
来源：
Japanese Journal of Applied Physics, Part 2: Letters | 1998年 / 37卷 / 11 A期
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