Error analysis for the far-field of a small plane source

被引:0
|
作者
Department of Technical Physics, Xidian University, Xi'an 710071, China [1 ]
机构
来源
Wuli Xuebao | / 9卷 / 1669期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Far-field phase extrapolation for marine source signatures
    Duren, RE
    Andersen, KD
    GEOPHYSICS, 1997, 62 (05) : 1636 - 1639
  • [22] Far-field analysis of the Malyuzhinets solution for plane and surface waves diffraction by an impedance wedge
    Norris, AN
    Osipov, AV
    WAVE MOTION, 1999, 30 (01) : 69 - 89
  • [23] Analysis of far-field distance of LED arrays based on an improved error calculation formula
    Cai, Wentao
    Liu, Xianming
    Zhang, Peng
    Chen, Weimin
    NONIMAGING OPTICS: EFFICIENT DESIGN FOR ILLUMINATION AND SOLAR CONCENTRATION X, 2013, 8834
  • [24] Coherent source transverse field profiles and far-field energy distribution
    Meyer, Ron
    TECHNOLOGIES FOR OPTICAL COUNTERMEASURES IX, 2012, 8543
  • [25] Numerical Analysis of Blast Effects and Mitigation in the Far-Field from Small Explosions
    Taylor, Adam G.
    APPLIED SCIENCES-BASEL, 2022, 12 (17):
  • [26] Hybrid multilevel plane wave based near-field far-field transformation utilising combined near- and far-field translations
    Schmidt, C. H.
    Eibert, T. E.
    ADVANCES IN RADIO SCIENCE, 2009, 7 : 17 - 22
  • [27] FAR-FIELD UNCERTAINTY DUE TO RANDOM NEAR-FIELD MEASUREMENT ERROR
    HOFFMAN, JB
    GRIMM, KR
    IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1988, 36 (06) : 774 - 780
  • [28] Detailed study of plane-plane cavity fundamental mode far-field structure
    Anokhov, S
    OPTOELECTRONIC METROLOGY, 1998, 4018 : 111 - 117
  • [29] The Geometry of Far-Field Passive Source Localization With TDOA and FDOA
    Pine, Karleigh Cameron
    Pine, Samuel
    Cheney, Margaret
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 2021, 57 (06) : 3782 - 3790
  • [30] Source coherence-based far-field intensity filtering
    Mei, Zhangrong
    Korotkova, Olga
    Mao, Yonghua
    OPTICS EXPRESS, 2015, 23 (19): : 24748 - 24758