Transmission electron microscopy and X-ray diffraction investigation of in segregation in MOVPE-grown InGaAs-based MQWs with either GaAs or AlGaAs barriers

被引：0
|
作者：
Frigeri, C. [1 ]
Di Paola, A. [1 ]
Gambacorti, N. [1 ]
Ritchie, D.M. [1 ]
Longo, F. [1 ]
Della Giovanna, M. [1 ]
机构：
[1] CNR-MASPEC Inst, Parma, Italy
来源：
Materials science & engineering. B, Solid-state materials for advanced technology | 1994年 / B28卷 / 1-3期
关键词：
High resolution transmission electron microscopy - High resolution x ray diffraction - Intensity profile - Multiquantum well structure;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：346 / 352
相关论文
共 48 条
  • [21] Investigation of structural parameters in heteroepitaxial systems based on InGaAs/GaAs by neutron diffraction and high-resolution x-ray diffractometry
    Ilinov, D.V.
    Shabrin, A.D.
    Sadilov, V.V.
    Pashkeev, D.A.
    Applied Physics, 2020, (05): : 56 - 65
  • [22] Analysis of the dislocation content in a deformed Co-based superalloy by transmission electron microscopy and X-ray diffraction
    Breuer, D
    Klimanek, P
    Muhle, U
    Martin, U
    ZEITSCHRIFT FUR METALLKUNDE, 1997, 88 (09): : 680 - 686
  • [23] Optical and structural properties in type-II InAlAs/AlGaAs quantum dots observed by photoluminescence, X-ray diffraction and transmission electron microscopy
    Ben Daly, A.
    Craciun, D.
    Ursu, E. Laura
    Lemaitre, A.
    Maaref, M. A.
    Iacomi, F.
    Vasile, B. S.
    Craciun, V.
    SUPERLATTICES AND MICROSTRUCTURES, 2017, 110 : 1 - 9
  • [24] Structural investigation of hydrous TiO2 precipitates and their aging products by X-ray diffraction, atomic force microscopy, and transmission electron microscopy
    Jalava, JP
    Heikkila, L
    Hovi, O
    Laiho, R
    Hiltunen, E
    Hakanen, A
    Harma, H
    INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 1998, 37 (04) : 1317 - 1323
  • [25] Structural investigation of hydrous TiO2 precipitates and their aging products by X-ray diffraction, atomic force microscopy, and transmission electron microscopy
    Kemira Pigments Oy, Pori, Finland
    Industrial and Engineering Chemistry Research, 1998, 37 (04): : 1317 - 1323
  • [26] Characterization of CuCl quantum dots grown in NaCl single crystals via optical measurements, X-ray diffraction, and transmission electron microscopy
    Miyajima, Kensuke
    Akatsu, Tatsuro
    Itoh, Ken
    JOURNAL OF CRYSTAL GROWTH, 2018, 490 : 84 - 88
  • [27] TRANSMISSION ELECTRON-MICROSCOPY, HIGH-RESOLUTION X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING STUDY OF STRAIN RELEASE IN INGAAS/GAAS BUFFER LAYERS
    SALVIATI, G
    LAZZARINI, L
    FERRARI, C
    FRANZOSI, P
    MILITA, S
    ROMANATO, F
    BERTI, M
    MAZZER, M
    DRIGO, AV
    BRUNI, MR
    SIMEONE, MG
    GAMBACORTI, N
    SCANNING MICROSCOPY, 1994, 8 (04) : 943 - 955
  • [28] Study of the structural properties of sputtered CoCrPt based on x-ray diffraction, small angle x-ray scattering, XAFS, and transmission electron (abstract) microscopy measurements
    Yumoto, S.
    Ohshima, N.
    Journal of Applied Physics, 1994, 75 (10 pt 2A):
  • [29] STRUCTURAL-ANALYSIS OF ALGAAS QUANTUM WIRES ON VICINAL (110)GAAS BY TRANSMISSION ELECTRON-MICROSCOPY AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY
    TAKEUCHI, M
    SHIBA, K
    HUANG, HK
    SATO, K
    INOUE, K
    MAEHASHI, K
    NAKASHIMA, H
    JOURNAL OF CRYSTAL GROWTH, 1995, 150 (1-4) : 441 - 445
  • [30] Investigations by high-resolution X-ray diffraction (HRXRD) and transmission electron microscopy (TEM) of (BeTe/ZnSe) superlattices grown by molecular beam epitaxy onto GaAs buffer epilayer
    Bousquet, V
    Laügt, M
    Vennégués, P
    Tournié, E
    Faurie, JP
    JOURNAL OF CRYSTAL GROWTH, 1999, 201 : 498 - 501
12345