Transmission electron microscopy and X-ray diffraction investigation of in segregation in MOVPE-grown InGaAs-based MQWs with either GaAs or AlGaAs barriers

被引：0
|
作者：
Frigeri, C. [1 ]
Di Paola, A. [1 ]
Gambacorti, N. [1 ]
Ritchie, D.M. [1 ]
Longo, F. [1 ]
Della Giovanna, M. [1 ]
机构：
[1] CNR-MASPEC Inst, Parma, Italy
来源：
Materials science & engineering. B, Solid-state materials for advanced technology | 1994年 / B28卷 / 1-3期
关键词：
High resolution transmission electron microscopy - High resolution x ray diffraction - Intensity profile - Multiquantum well structure;
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页码：346 / 352
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