Soft, entirely photoplastic probes for scanning force microscopy

被引:0
|
作者
机构
来源
Rev Sci Instrum | / 5卷 / 2398期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] SCANNING-TUNNELING-MICROSCOPY AND SCANNING FORCE MICROSCOPY
    ALVARADO, SF
    SURFACE REVIEW AND LETTERS, 1995, 2 (05) : 607 - 617
  • [22] Instrumentation for Scanning Force Microscopy and Friction Force Microscopy
    Marti, O
    MICRO/NANOTRIBOLOGY AND ITS APPLICATIONS, 1997, 330 : 17 - 34
  • [23] Rapid optimization of a lactate biosensor design using soft probes scanning electrochemical microscopy
    Pribil, Medeya M.
    Cortes-Salazar, Fernando
    Andreyev, Egor A.
    Lesch, Andreas
    Karyakina, Elena E.
    Voronin, Oleg G.
    Girault, Hubert H.
    Karyakin, Arkady A.
    JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2014, 731 : 112 - 118
  • [24] Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
    Dobson, PS
    Weaver, JMR
    Holder, MN
    Unwin, PR
    Macpherson, JV
    ANALYTICAL CHEMISTRY, 2005, 77 (02) : 424 - 434
  • [25] Mechanics of soft interfaces studied with displacement-controlled scanning force microscopy
    Goertz, M. P.
    Moore, N. W.
    PROGRESS IN SURFACE SCIENCE, 2010, 85 (9-12) : 347 - 397
  • [26] Functional Probes for Scanning Probe Microscopy
    Akiyama, K.
    Eguchi, T.
    Hamada, M.
    An, T.
    Fujikawa, Y.
    Hasegawa, Y.
    Sakurai, T.
    FRONTIERS IN MATERIALS RESEARCH, 2008, 10 : 305 - +
  • [27] Functional Probes for Scanning Probe Microscopy
    Akiyama, K.
    Eguchi, T.
    An, T.
    Fujikawa, Y.
    Sakurai, T.
    Hasegawa, Y.
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 22 - 25
  • [28] Submicron probes for scanning electrochemical microscopy
    Li, Michelle S. M.
    Filice, Fraser P.
    Ding, Zhifeng
    CANADIAN JOURNAL OF CHEMISTRY, 2018, 96 (03) : 328 - 335
  • [29] Novel probes for scanning probe microscopy
    Oesterschulze, E
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S3 - S9
  • [30] Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images
    Taatjes, DJ
    Quinn, AS
    Lewis, MR
    Bovill, EG
    MICROSCOPY RESEARCH AND TECHNIQUE, 1999, 44 (05) : 312 - 326