Soft, entirely photoplastic probes for scanning force microscopy

被引:0
|
作者
机构
来源
Rev Sci Instrum | / 5卷 / 2398期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Soft, entirely photoplastic probes for scanning force microscopy
    Genolet, G
    Brugger, J
    Despont, M
    Drechsler, U
    Vettiger, P
    de Rooij, NF
    Anselmetti, D
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (05): : 2398 - 2401
  • [2] All-photoplastic, soft cantilever cassette probe for scanning force microscopy
    Genolet, G
    Despont, M
    Vettiger, P
    Anselmetti, D
    de Rooij, NF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (02): : 617 - 620
  • [3] Soft Stylus Probes for Scanning Electrochemical Microscopy
    Cortes-Salazar, Fernando
    Traeuble, Markus
    Li, Fei
    Busnel, Jean-Marc
    Gassner, Anne-Laure
    Hojeij, Mohamad
    Wittstock, Gunther
    Girault, Hubert H.
    ANALYTICAL CHEMISTRY, 2009, 81 (16) : 6889 - 6896
  • [4] Micromachined probes for high frequency scanning force microscopy and scanning thermal microscopy
    Stopka, M
    Munster, S
    Leinhos, T
    Mihalcea, C
    Scholz, W
    Leyk, A
    Mertin, W
    Oesterschulze, E
    MICROMACHINING AND IMAGING, 1997, 3009 : 92 - 100
  • [5] Injection-moulded scanning force microscopy probes
    McFarland, AW
    Poggi, MA
    Bottomley, LA
    Colton, JS
    NANOTECHNOLOGY, 2005, 16 (08) : 1249 - 1252
  • [6] CALIBRATION AND EVALUATION OF SCANNING-FORCE-MICROSCOPY PROBES
    SHEIKO, SS
    MOLLER, M
    REUVEKAMP, EMCM
    ZANDBERGEN, HW
    PHYSICAL REVIEW B, 1993, 48 (08): : 5675 - 5678
  • [7] Polypropylene-functionalized probes for scanning force microscopy
    González-Ronda, L
    Kaberline, SL
    Durieux, EL
    POLYMER INTERFACES AND THIN FILMS, 2002, 710 : 265 - 270
  • [9] Nanoscale caliper for direct measurement of scanning force microscopy probes
    Biscarini, F
    Levy, P
    APPLIED PHYSICS LETTERS, 1997, 71 (07) : 888 - 890
  • [10] Probes for magnetic force microscopy imaging of soft magnetic samples
    Memmert, U
    Müller, AN
    Hartmann, U
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2000, 11 (09) : 1342 - 1347