Testing and fault detecting of analog integrated circuit

被引：0
|
作者：
Wang, Zhihua [1 ]
机构：
[1] Tsinghua Univ, Beijing, China
来源：
Tien Tzu Hsueh Pao/Acta Electronica Sinica | 1995年 / 23卷 / 10期
关键词：
Integrated circuit testing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：81 / 85
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