Analog integrated circuit parameter fault diagnosis using artificial neural network

被引：0
|
作者：
Zhang, JF
Gan, JR
Yao, LS
机构：
来源：
1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS | 1996年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
An artificial neural network method used for analog IC parameter fault diagnosis is presented in this paper. It is fast and accurate. Therefore it has boundless prospects in the field of analog IC parameter fault diagnosis.
引用
收藏
页码：400 / 403
页数：4
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