Determination of valence band discontinuities in Si/Si1-xGex/Si heterojunctions by capacitance-voltage techniques

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[1] Brighten, J.C.
[2] Hawkins, I.D.
[3] Peaker, A.R.
[4] Parker, E.H.C.
[5] Whall, T.E.
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Brighten, J.C. | 1894年 / 74期
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