Direction finding properties analysis of spatial spectrum estimation basing on the maximum likelihood method

被引:0
|
作者
Yun, Xiaohua [1 ]
Wang, Li [1 ]
Yun, Caihua [1 ]
Zhang, Guochun [1 ]
机构
[1] Nanjing Univ of Science and, Technology, Nanjing, China
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
5
引用
收藏
页码:70 / 72
相关论文
共 50 条
  • [31] Maximum likelihood technique for direction of arrival estimation in adaptive arrays
    Urazgildiyev, IR
    MMET 2000: INTERNATIONAL CONFERENCE ON MATHEMATICAL METHODS IN ELECTROMAGNETIC THEORY, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2000, : 221 - 223
  • [32] MAXIMUM LIKELIHOOD ESTIMATION OF THE DIRECTION OF SOUND IN A REVERBERANT NOISY ENVIRONMENT
    Mansour, Mohamed F.
    2024 18TH INTERNATIONAL WORKSHOP ON ACOUSTIC SIGNAL ENHANCEMENT, IWAENC 2024, 2024, : 16 - 20
  • [33] Deterministic Maximum Likelihood Direction of Arrival Estimation using GSA
    Sharma, Abhinav
    Mathur, Sanjay
    2016 INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONICS, AND OPTIMIZATION TECHNIQUES (ICEEOT), 2016, : 415 - 419
  • [34] Improving the threshold performance of maximum likelihood estimation of direction of arrival
    Krummenauer, R.
    Cazarotto, M.
    Lopes, A.
    Larzabal, P.
    Forster, P.
    SIGNAL PROCESSING, 2010, 90 (05) : 1582 - 1590
  • [35] An Efficient Maximum Likelihood Method for Direction-of-Arrival Estimation via Sparse Bayesian Learning
    Liu, Zhang-Meng
    Huang, Zhi-Tao
    Zhou, Yi-Yu
    IEEE TRANSACTIONS ON WIRELESS COMMUNICATIONS, 2012, 11 (10) : 3607 - 3617
  • [36] MAXIMUM-LIKELIHOOD ESTIMATION OF TURBULENCE SPECTRUM PARAMETERS
    MARK, WD
    AIAA JOURNAL, 1984, 22 (01) : 42 - 50
  • [37] MAXIMUM LIKELIHOOD ESTIMATION OF TURBULENCE SPECTRUM PARAMETERS.
    Mark, William D.
    1600, (22):
  • [38] LOCATION AND SPECTRUM ESTIMATION BY APPROXIMATE MAXIMUM-LIKELIHOOD
    BOHME, JF
    ADVANCED ALGORITHMS AND ARCHITECTURES FOR SIGNAL PROCESSING IV, 1989, 1152 : 326 - 337
  • [39] Maximum likelihood estimation for yield analysis
    Ferguson, FJ
    Yu, JL
    1996 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 1996, : 149 - 157
  • [40] Maximum likelihood estimation for failure analysis
    Yu, JL
    Ferguson, FJ
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1998, 11 (04) : 681 - 691