Observation of amorphous recording marks using reflection-mode near-field scanning optical microscope supported by optical interference method

被引：0
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作者：
Sakai, Masaru [1 ]
Mononobe, Shuji [1 ,2 ]
Yusu, Keiichiro [3 ]
Tadokoro, Toshiyasu [4 ]
Saiki, Toshiharu [1 ,5 ]
机构：
[1] Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST), KSP East-408, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan
[2] Kunitake Organization and Function Research Area, PRESTO, Japan Science and Technology Agency, Japan
[3] Corporate Research and Development Center, Toshiba Corporation, 1 Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
[4] Techno-Synergy, Inc., 2-46-16 Sanda-cho, Hachioji, Tokyo 193-0832, Japan
[5] Department of Electronics and Electrical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2005年 / 44卷 / 9 A期
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页码：6855 / 6858
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