Observation of amorphous recording marks using reflection-mode near-field scanning optical microscope supported by optical interference method

被引：0
|
作者：
Sakai, Masaru [1 ]
Mononobe, Shuji [1 ,2 ]
Yusu, Keiichiro [3 ]
Tadokoro, Toshiyasu [4 ]
Saiki, Toshiharu [1 ,5 ]
机构：
[1] Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST), KSP East-408, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan
[2] Kunitake Organization and Function Research Area, PRESTO, Japan Science and Technology Agency, Japan
[3] Corporate Research and Development Center, Toshiba Corporation, 1 Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
[4] Techno-Synergy, Inc., 2-46-16 Sanda-cho, Hachioji, Tokyo 193-0832, Japan
[5] Department of Electronics and Electrical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2005年 / 44卷 / 9 A期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：6855 / 6858
相关论文
共 50 条
  • [1] Observation of amorphous recording marks using reflection-mode near-field scanning optical microscope supported by optical interference method
    Sakai, M
    Mononobe, S
    Yusu, K
    Tadokoro, T
    Saiki, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (9A): : 6855 - 6858
  • [2] Near-field optical recording by reflection-mode near-field scanning optical microscope: Submicron-sized marks and their thermodynamic stability
    Kim, Myong R.
    Park, June-Hyoung
    Jhe, Wonho
    2000, JJAP, Japan (39):
  • [3] Near-field optical recording by reflection-mode near-field scanning optical microscope: Submicron-sized marks and their thermodynamic stability
    Kim, MR
    Park, JH
    Jhe, W
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (2B): : 984 - 985
  • [4] Observation of magnetic domains using a reflection-mode scanning near-field optical microscope
    Durkan, C
    Shvets, IV
    Lodder, JC
    APPLIED PHYSICS LETTERS, 1997, 70 (10) : 1323 - 1325
  • [5] A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope
    Wurtz, G
    Bachelot, R
    Royer, P
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (04): : 1735 - 1743
  • [6] Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode
    蔡微
    商广义
    姚骏恩
    ChineseOpticsLetters, 2010, 8 (03) : 313 - 315
  • [7] Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode
    Cai, Wei
    Shang, Guangyi
    Yao, Jun'en
    CHINESE OPTICS LETTERS, 2010, 8 (03) : 313 - 315
  • [8] Modulation imaging in reflection-mode near-field scanning optical microscopy
    Kerimo, J
    Büchler, M
    Smyrl, WH
    ULTRAMICROSCOPY, 2000, 84 (3-4) : 127 - 131
  • [9] Polarization effects in reflection-mode scanning near-field optical microscopy
    Durkan, C
    Shvets, IV
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (04) : 1837 - 1843
  • [10] Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip
    Bachelot, R
    Gleyzes, P
    Boccara, AC
    APPLIED OPTICS, 1997, 36 (10): : 2160 - 2170
12345