Investigation of the defect structure of thin single-crystalline CoSi2 (B) films on Si(111) by transmission electron microscopy

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Bulle-Lieuwma, C.W.T.
Vandenhoudt, D.E.W.
Henz, J.
Onda, N.
von Kanel, H.
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Journal of Applied Physics | 1993年 / 73卷 / 07期
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