Residual stress state of brazed ceramic/metal compounds, determined by analytical methods and X-ray residual stress measurements

被引：0
|
作者：
机构：
[1] Iancu, Otto T.
[2] Munz, Dietrich
来源：
Iancu, Otto T. | 1600年 / 73期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] THE CHALLENGE OF X-RAY DIFFRACTION RESIDUAL STRESS MEASUREMENTS ON HELICAL COMPRESSION SPRINGS
    Lowe-Ma, C. K.
    Drews, A. R.
    Krause, A. R.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 481 - 481
  • [32] Polychromatic X-ray method for residual-stress measurements in a subsurface layer
    Shibano, J
    Tadano, S
    Ukai, T
    EXPERIMENTAL MECHANICS, 1996, 36 (01) : 24 - 32
  • [33] Polychromatic X-ray measurements of anisotropic residual stress in bovine femoral bone
    Todoh, M
    Tadano, S
    Shibano, J
    Ukai, T
    JSME INTERNATIONAL JOURNAL SERIES C-MECHANICAL SYSTEMS MACHINE ELEMENTS AND MANUFACTURING, 2000, 43 (04): : 795 - 801
  • [34] FEM CALCULATIONS FOR CORRECTION OF X-RAY RESIDUAL-STRESS PROFILE MEASUREMENTS
    PEDERSEN, TF
    HANSSON, ILH
    NDT INTERNATIONAL, 1988, 21 (06): : 455 - 455
  • [35] Calculation on residual stress of ZnO ceramic/copper brazed joints
    Liu, Yuyang
    Wang, Xingming
    Bai, Xue
    Li, Siqin
    Sun, Jing
    Shi, Zhixia
    Xiyou Jinshu/Chinese Journal of Rare Metals, 2015, 39 (11): : 1004 - 1009
  • [36] Evaluation of Residual Stress by X-Ray Diffraction and Correlative Stress Modelling
    Kumar, Sandeep
    Crivoi, Alexandru
    Tan, Ming Jen
    Tai, Anna
    Marinescu, Iulian
    RESIDUAL STRESSES 2016: ICRS-10, 2017, 2 : 211 - 216
  • [37] X-ray stress and residual stress analysis of Charpy steel specimens
    Hoffmann, Joachim Ernst
    Clemens, Helmut
    MATERIALPRUFUNG, 2007, 49 (11-12): : 588 - 595
  • [38] Residual stress of aluminum thin films measured by X-ray and curvature methods
    Tanaka, K
    Ishihara, K
    Akiniwa, Y
    Ohta, H
    MATERIALS SCIENCE RESEARCH INTERNATIONAL, 1996, 2 (03): : 153 - 159
  • [39] Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques
    Atar, E
    Sarioglu, C
    Demirler, U
    Kayali, ES
    Cimenoglu, H
    SCRIPTA MATERIALIA, 2003, 48 (09) : 1331 - 1336
  • [40] Residual stress and strain in CdZnTe wafer examined by X-ray diffraction methods
    Zeng, D.
    Jie, W.
    Wang, T.
    Zha, G.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2007, 86 (02): : 257 - 260
12345