Total reflection x-ray photoelectron spectroscopy

被引:0
|
作者
Kawai, J.
Hayakawa, S.
Kitajima, Y.
Maeda, K.
Gohshi, Y.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] TOTAL REFLECTION X-RAY SPECTROMETRY
    LEYDEN, DE
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1985, 4 (03) : R8 - R9
  • [42] Total reflection X-ray fluorescence
    Schmeling, Martina
    PHYSICAL SCIENCES REVIEWS, 2019, 4 (07)
  • [43] Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer
    Kyoto Univ, Kyoto, Japan
    Appl Phys Lett, 14 (1921-1923):
  • [44] Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer
    Hayashi, K
    Kawato, S
    Horiuchi, T
    Matsushige, K
    Kitajima, Y
    Takenaka, H
    Kawai, J
    APPLIED PHYSICS LETTERS, 1996, 68 (14) : 1921 - 1923
  • [45] Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy
    Baur, K
    Kerner, J
    Brennan, S
    Singh, A
    Pianetta, P
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (08) : 4642 - 4647
  • [46] X-ray Photoelectron Spectroscopy of Isolated Nanoparticles
    Sublemontier, Olivier
    Nicolas, Christophe
    Aureau, Damien
    Patanen, Minna
    Kintz, Harold
    Liu, Xiaojing
    Gaveau, Marc-Andre
    Le Garrec, Jean-Luc
    Robert, Emmanuel
    Barreda, Flory-Anne
    Etcheberry, Arnaud
    Reynaud, Cecile
    Mitchell, James B.
    Miron, Catalin
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2014, 5 (19): : 3399 - 3403
  • [47] X-RAY PHOTOELECTRON SPECTROSCOPY FOR ANALYSIS OF SOLIDS
    FLUCK, E
    CHEMIE INGENIEUR TECHNIK, 1972, 44 (14) : 910 - &
  • [48] Materials characterization by X-ray photoelectron spectroscopy
    Nascente, PAP
    JOURNAL OF MOLECULAR CATALYSIS A-CHEMICAL, 2005, 228 (1-2) : 145 - 150
  • [49] Spatial resolution in X-ray photoelectron spectroscopy
    Drummond, IW
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1996, 354 (1719): : 2667 - 2682
  • [50] Characterization of dendrimers by X-ray photoelectron spectroscopy
    Demathieu, C
    Chehimi, MM
    Lipskier, JF
    Caminade, AM
    Majoral, JP
    APPLIED SPECTROSCOPY, 1999, 53 (10) : 1277 - 1281