Quantum mechanical electron transmission coefficient at interfaces and ballistic electron emission microscopy

被引:0
|
作者
Universitaet Erlangen-Nuernberg, Erlangen, Germany [1 ]
机构
来源
Surf Sci | / 1-2卷 / L810-L815期
关键词
Band structure - Electron emission - Electron microscopy - Electron transport properties - Gold - Mathematical models - Quantum theory - Semiconducting silicon - Semiconductor metal boundaries - Tensors;
D O I
暂无
中图分类号
学科分类号
摘要
We derive the quantum mechanical transmission coefficient for the electron transport across a plane interface of a metal/semiconductor or semiconductor/semiconductor heterostructure. An effective mass model is used for the conduction band in each layer of the system. Non-diagonal mass tensors and indirect band minima are covered by the model. The quantum effects for the electron transmission are investigated for the system Au(111)/Si(111) as a test case. We find sizeable corrections originating from quantum effects.
引用
收藏
相关论文
共 50 条
  • [1] Quantum mechanical electron transmission coefficient at interfaces and ballistic electron emission microscopy
    Menegozzi, R
    Reinhard, PG
    Schulz, M
    SURFACE SCIENCE, 1998, 411 (1-2) : L810 - L815
  • [2] BALLISTIC ELECTRON-EMISSION MICROSCOPY OF SEMICONDUCTOR INTERFACES
    WILLIAMS, RH
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1991, (117): : 245 - 252
  • [3] Ballistic electron emission microscopy on quantum wires
    Smoliner, J
    Eder, C
    Strasser, G
    Gornik, E
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1997, 204 (01): : 386 - 392
  • [4] IMAGING SUBSURFACE INTERFACES BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
    BELL, LD
    KAISER, WJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C373 - C373
  • [5] Ballistic electron emission microscopy for nonepitaxial metal/semiconductor interfaces
    Smith, DL
    Lee, EY
    Narayanamurti, V
    PHYSICAL REVIEW LETTERS, 1998, 80 (11) : 2433 - 2436
  • [6] The ballistic electron emission microscopy in the characterization of quantum dots
    Hutagalung, S. D.
    Yaacob, K. A.
    Keat, Y. C.
    NANOSCIENCE AND TECHNOLOGY, PTS 1 AND 2, 2007, 121-123 : 529 - 532
  • [7] Electron transport in ballistic electron emission microscopy
    R. Menegozzi
    P.-G. Reinhard
    M. Schulz
    Applied Physics A, 1998, 66 : S897 - S900
  • [8] Electron transport in ballistic electron emission microscopy
    Menegozzi, R
    Reinhard, PG
    Schulz, M
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S897 - S900
  • [9] Ballistic electron emission microscopy to probe interfaces of simple device structures
    Ke, ML
    Williams, RH
    Westwood, DI
    Richardson, BE
    MICROELECTRONIC ENGINEERING, 1996, 31 (1-4) : 195 - 213
  • [10] Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces
    Bell, LD
    Smith, RP
    McDermott, BT
    Gertner, ER
    Pittman, R
    Pierson, RL
    Sullivan, GJ
    APPLIED PHYSICS LETTERS, 1998, 72 (13) : 1590 - 1592