Electron transport in ballistic electron emission microscopy

被引：0
|
作者：
R. Menegozzi
P.-G. Reinhard
M. Schulz
机构：
[1] Institut für Angewandte Physik,
[2] Universität Erlangen-Nürnberg,undefined
[3] Staudtstr. 7,undefined
[4] D-91058 Erlangen,undefined
[5] Germany,undefined
[6] Institut für Theoretische Physik II,undefined
[7] Universität Erlangen-Nürnberg,undefined
[8] Staudtstr. 7,undefined
[9] D-91058 Erlangen,undefined
[10] Germany (Fax: +49-9131/858423,undefined
[11] E-mail: mpap01@rzmail.uni-erlangen.de),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 73.50.-h; 07.79.-v;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S897 / S900
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