GENERATION-RECOMBINATION NOISE IN SILICON p + -n-n + JUNCTIONS WITH A STRONGLY COMPENSATED n-TYPE REGION.

被引:0
|
作者
Matukas, I.P. [1 ]
Palenskis, V.P. [1 ]
机构
[1] Vilnius State Univ, Vilnius, USSR, Vilnius State Univ, Vilnius, USSR
来源
| 1600年 / 18期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
SEMICONDUCTOR DEVICES
引用
收藏
相关论文
共 50 条
  • [41] Incomplete Ionization and Carrier Mobility in Compensated p-Type and n-Type Silicon
    Forster, M.
    Rougieux, F. E.
    Cuevas, A.
    Dehestru, B.
    Thomas, A.
    Fourmond, E.
    Lemiti, M.
    2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2, 2013,
  • [42] Incomplete Ionization and Carrier Mobility in Compensated p-Type and n-Type Silicon
    Forster, M.
    Rougieux, F. E.
    Cuevas, A.
    Dehestru, B.
    Thomas, A.
    Fourmond, E.
    Lemiti, M.
    IEEE JOURNAL OF PHOTOVOLTAICS, 2013, 3 (01): : 108 - 113
  • [43] RECOMBINATION MEASUREMENT OF N-TYPE HEAVILY DOPED LAYER IN HIGH/LOW SILICON JUNCTIONS
    BELLONE, S
    BUSATTO, G
    RANSOM, CM
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (03) : 532 - 537
  • [44] ELECTROLUMINESCENCE CHARACTERISTICS OF EPITAXIAL GaAs p-n JUNCTIONS WITH DELIBERATELY COMPENSATED p- AND n-TYPE REGIONS.
    Alferov, Zh.I.
    Andreev, V.M.
    Garbuzov, D.Z.
    Ermakova, A.N.
    Morozov, E.P.
    Trukan, M.K.
    1973, 6 (10): : 1726 - 1730
  • [46] SPIN SUSCEPTIBILITY IN STRONGLY DOPED N-TYPE SILICON
    BERGGREN, KF
    SERNELIUS, B
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 268 - 268
  • [47] Recombination Activity and Impact of the Boron-Oxygen-Related Defect in Compensated n-Type Silicon
    Rougieux, F. E.
    Forster, M.
    Macdonald, D.
    Cuevas, A.
    Lim, B.
    Schmidt, J.
    IEEE JOURNAL OF PHOTOVOLTAICS, 2011, 1 (01): : 54 - 58
  • [48] Flicker Noise in N-type and P-type Silicon Nanowire Transistors
    Yang, Seungwon
    Son, Younghwan
    Suk, Sung Dae
    Kim, Dong-Won
    Park, Donggun
    Oh, Kyungseok
    Shin, Hyungcheol
    2008 IEEE SILICON NANOELECTRONICS WORKSHOP, 2008, : 43 - +
  • [49] GENERATION-RECOMBINATION NOISE IN P-TYPE INSB
    KAZANTSEV, GA
    ROZHDEST.VV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1967, 1 (05): : 550 - +
  • [50] THEORY OF INTERBAND AUGER RECOMBINATION IN N-TYPE SILICON
    LAKS, DB
    NEUMARK, GF
    HANGLEITER, A
    PANTELIDES, ST
    PHYSICAL REVIEW LETTERS, 1988, 61 (10) : 1229 - 1232