Redundancy Improves Yield of Semiconductor Memories.

被引：0

作者：

Heinrich, Peter

机构：

来源：

Elektronik Munchen | 1981年 / 30卷 / 20期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

DATA STORAGE, SEMICONDUCTOR

引用

页码：79 / 86

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[38] Belgian memories.
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