Sequential circuit test generation by real number simulation

被引：0
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作者：
机构：
[1] Hikone, Kazunori
[2] Ikeda, Mitsuji
[3] Hatayama, Kazumi
[4] Hayashi, Terumine
来源：
Hikone, Kazunori | 1600年 / 24期
关键词：
Stuck at fault - Test generation - Test pattern;
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摘要：
(Edited Abstract)
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