Study on a measuring method for cutting edges of diamond tools by atomic force microscope(AFM)

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作者：
Sun, Tao
Tan, Jiubin
Dong, Shen
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来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2000年 / 21卷 / 01期
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页码：54 / 57
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