MAGNETIC DOMAIN OBSERVATION USING SPIN-POLARIZED SCANNING ELECTRON MICROSCOPY.

被引：0
|
作者：
Koike, K. [1 ]
Matsuyama, H. [1 ]
Todokoro, H. [1 ]
Hayakawa, K. [1 ]
机构：
[1] Hitachi Ltd, Kokubunji, Jpn, Hitachi Ltd, Kokubunji, Jpn
来源：
| 1987年 / 1卷 / 01期
关键词：
MAGNETIC MATERIALS - Microscopic Examination;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A new apparatus, spin-polarized scanning electron microscope (SEM), has been developed. This is a unique apparatus, which forms images by electron spin polarization. By using this device, magnetic domain images can be obtained because secondary electrons from ferromagnetic samples are polarized representing the magnetization of the sample originating point. This method provides new capabilities, such as magnetic contrast independent of surface morphology, detection of magnetization direction, and high spatial resolution.
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页码：31 / 39
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