共 16 条
- [1] Total cross section of electron stimulated desorption of hydrogen from hydrogen-terminated Ge/Si(001) as observed by time of flight elastic recoil detection analysis JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (5A): : 2878 - 2880
- [5] In situ monitoring of hydrogen-surfactant effect during Ge growth on Si(001) using coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 419 - 423
- [6] Adsorption of H on the Ge/Si(001) surface as studied by time-of-flight elastic recoil detection analysis and coaxial impact collision ion scattering spectroscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (3 A): : 1359 - 1362
- [7] Adsorption of H on the Ge/Si(001) surface as studied by time-of-flight elastic recoil detection analysis and coaxial impact collision ion scattering spectroscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (3A): : 1359 - 1362
- [8] Quantitative hydrogen analysis through time of flight-elastic recoil detection analysis using medium energy ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 450 : 310 - 314
- [9] Two-dimensional hydrogen analysis by time-of-flight-type electron-stimulated desorption spectroscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1997, 36 (9AB): : L1254 - L1256
- [10] Two-dimensional hydrogen analysis on solid surfaces by time-of-flight electron-stimulated desorption microscope Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (7 B): : 4363 - 4365