共 50 条
- [1] Adsorption of H on the Ge/Si(001) surface as studied by time-of-flight elastic recoil detection analysis and coaxial impact collision ion scattering spectroscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (3A): : 1359 - 1362
- [3] In situ monitoring of hydrogen-surfactant effect during Ge growth on Si(001) using coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 419 - 423
- [4] Coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis for in situ monitoring of surface processes in gas phase atmosphere JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (6A): : L576 - L579
- [5] Ta segregation at the Ti(001) surface studied by time-of-flight impact-collision ion scattering spectroscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 184 (04): : 555 - 558
- [9] Adsorption of atomic hydrogen on the Si(001) 4x3-In surface studied by coaxial impact collision ion scattering spectroscopy and scanning tunneling microscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (03): : 983 - 988