3-D digital picture effect equipment DPE-X

被引：0
|
作者：
Tanaka, Yutaka [1 ]
机构：
[1] Toshiba Corp, Japan
来源：
JEE. Journal of electronic engineering | 1988年 / 25卷 / 255期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：44 / 46
相关论文
共 50 条
  • [21] CONFOCAL IMAGING FOR 3-D DIGITAL MICROSCOPY
    CARLSSON, K
    ASLUND, N
    APPLIED OPTICS, 1987, 26 (16): : 3232 - 3238
  • [22] 3-D nFPGA: A reconfigurable architecture for 3-D CMOS/nanomaterial hybrid digital circuits
    Dong, Chen
    Chen, Deming
    Haruehanroengra, Sansiri
    Wang, Wei
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2007, 54 (11) : 2489 - 2501
  • [23] 3-D Digital flows in cerebrovascular phantoms
    Das, Nirmal
    Rakshit, Pranati
    Nasipuri, Mita
    Basu, Subhadip
    2017 NINTH INTERNATIONAL CONFERENCE ON ADVANCES IN PATTERN RECOGNITION (ICAPR), 2017, : 216 - 220
  • [24] The 3-D model as the basis of the digital twin
    Wedel, Frederik
    Opitz, Daniel
    Tiedemann, Christoph
    Meyer-Westphal, Markus
    BAUTECHNIK, 2022, 99 (02) : 104 - 113
  • [25] Stability of digital nonlinear 3-D systems
    Kurek, JE
    ISIE'96 - PROCEEDINGS OF THE IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2, 1996, : 140 - 143
  • [26] Experimental 3-D digital TV studio
    Cockshott, WP
    Hoff, S
    Nebel, JC
    IEE PROCEEDINGS-VISION IMAGE AND SIGNAL PROCESSING, 2003, 150 (01): : 28 - 33
  • [27] Application in 3-D measurement of digital photogrammetry
    Deng, Wen-Yi
    Lu, Nai-Guang
    Dong, Ming-Li
    Zhang, Jin-Yu
    Yan, Bi-Xi
    Guangdianzi Jiguang/Journal of Optoelectronics Laser, 2001, 12 (07): : 697 - 700
  • [28] BIBO stability in 3-D digital filters
    Roytman, LM
    Potievsky, VF
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2003, 50 (12) : 1574 - 1576
  • [29] Contributions of digital photogrammetry to 3-D PTV
    Maas, HG
    THREE-DIMENSIONAL VELOCITY AND VORTICITY MEASURING AND IMAGE ANALYSIS TECHNIQUES, 1996, 4 : 191 - 207
  • [30] Digital 3d x-ray microtomographic scanners for electronic equipment testing
    Klestov, S. A.
    Syryamkin, V., I
    Suntsov, S. B.
    INTERNATIONAL CONFERENCE ACTUAL TRENDS IN RADIOPHYSICS, 2020, 1499
12345