Fast Determination of the Thermal Resistance of Semiconductor Devices.

被引:0
|
作者
Poehlmann, Bernd
机构
来源
Elektronik Munchen | 1980年 / 29卷 / 22期
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
SEMICONDUCTOR DEVICES
引用
下载
收藏
页码:125 / 127
相关论文
共 50 条
  • [11] MICROWAVE AND MILLIMETER WAVE SEMICONDUCTOR DEVICES.
    Fank, F.Beringer
    International Telemetering Conference (Proceedings), 1978, 14 : 905 - 911
  • [12] ON THE BALLISTIC TRANSPORT IN SUBMICRON SEMICONDUCTOR DEVICES.
    Marciak-Kozlowska, Janina
    Bulletin of the Polish Academy of Sciences: Technical Sciences, 1986, 34 (3-4): : 235 - 239
  • [13] Cooling and Mounting of Power Semiconductor Devices.
    Wetzel, Peter
    Elektronik Munchen, 1980, (08): : 97 - 104
  • [14] AUTOMATING THE PRODUCTION OF POWER SEMICONDUCTOR DEVICES.
    Kyuts, R.V.
    Toomsoo, G.K.
    Soviet electrical engineering, 1984, 55 (04): : 44 - 51
  • [15] TRANSMISSION ELECTRON MICROSCOPY OF SEMICONDUCTOR MATERIALS AND DEVICES.
    Marcus, R.B.
    Scanning Electron Microscopy, 1985, v : 1001 - 1009
  • [16] SIMPLE METHOD OF ASSESSING THE RELIABILITY OF SEMICONDUCTOR DEVICES.
    Candade, Vittal S.
    QR journal, 1985, 12 (02): : 61 - 64
  • [17] A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices
    Chen, B
    Ooi, BL
    Kooi, PS
    2004 9TH IEEE SINGAPORE INTERNATIONAL CONFERENCE ON COMMUNICATION SYSTEMS (ICCS), 2004, : 588 - 591
  • [18] A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices
    Ooi, BL
    Chen, B
    Lin, FJ
    Kooi, PS
    Hui, CS
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2002, 35 (06) : 499 - 502
  • [19] Evaluation of Current Capacity of Power Semiconductor Devices.
    Lehmann, Erhard
    Elektrotechnische Zeitschrift Ausgabe B, 1974, 26 (17): : 426 - 428
  • [20] PHOTOLITHOGRAPHY AND ELECTROLITHOGRAPHY FOR FINE GEOMETRY SEMICONDUCTOR DEVICES.
    Singh, Amarjit
    IETE Journal of Research, 1980, 26 (11) : 540 - 545