Measurement considerations for antenna pattern accuracy

被引：0
|
作者：
Swanstrom, John [1 ]
机构：
[1] Hewlett-Packard Co, Santa Rosa, United States
来源：
ITG-Fachbericht | 1998年 / 149卷
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D O I：
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摘要：
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页码：245 / 250
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