NEW CIRCUIT FOR SYNTHETIC AUTORECLOSING TEST DUTIES UNDER SHORT CIRCUIT CONDITIONS ON HIGH-POWER CIRCUIT-BREAKERS.

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作者：
Manganaro, S.
Rovelli, S.
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| 1600年 / IEEE, New York, NY卷
关键词：
ELECTRIC EQUIPMENT - Testing;
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摘要：
Two new synthetic making circuits which can easily be combined with the existing widely known synthetic circuits for breaking tests have been studied theoretically and developed in an industrial laboratory. Suitable testing procedures and these circuits lead to a solution which is technically correct and cheap, and is applicable to any type of high voltage circuit breaker fitted or not fitted with making and breaking resistors.
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