Low intensity beam diagnostics with microchannel plate detectors

被引：0

作者：

Cuttone, G. ^{[1
]}

De Martinis, C. ^{[1
]}

Finocchiaro, P. ^{[1
]}

Giove, D. ^{[1
]}

Raia, G. ^{[1
]}

Rovelli, A. ^{[1
]}

机构：

[1] INFN-LNS, Catania, Italy

来源：

Proceedings of the IEEE Particle Accelerator Conference | 1998年 / 2卷

关键词：

Detectors - Electric current measurement - Ionization of gases - Pressure effects;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A non destructive low intensity ion beam profile monitor has been designed and tested. The system is based on a MCP that detects the residual gas ionization produced by the ion beam. The detector is coupled to a phosphorous screen for the readout of the vertical and horizontal density profiles. Experimental results have shown that the system is able to detect beam intensities as low as 108 pps with a local vacuum in the measuring box of the order of 8×10-6 mbar. In the paper we report the results so far obtained in beam sensitivity and measure precision as a function of the residual pressure and in different regimes of the detector.

引用

页码：2038 / 2040

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