Real space imaging of GaAs/AlAs(0 0 1) heterointerfaces

被引：0
|
作者：
Behrend, J. [1 ]
Wassermeier, M. [1 ]
Braun, W. [1 ]
Krispin, P. [1 ]
Ploog, K.H. [1 ]
机构：
[1] Paul-Drude-Inst fuer, Festkoerperelektronik, Berlin, Germany
来源：
Journal of Crystal Growth | 1997年 / 175-176卷 / pt 1期
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页码：178 / 183
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