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Stray-field magnetic resonance imaging of solid materials
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|作者:
Lockheed Palo Alto Research Lab, Palo Alto, United States
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This work was supportedb y the LockheedI nde-pendentR esearcha nd DevelopmenFt und. The authors acknowledgeth e assistanceo f L. Fisher;
D;
Lueng;
a ndJ . Zegarskiin thep reparatioonf someo f thes amplese xaminedin this work. The authorsa lso acknowledgeth e contributionsm ade by I.L. Lim;
J.W;
Sinton;
a ndS. Yost;
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