共 50 条
- [31] Properties of SFS heterostructures prepared by a focused-ion-beam technique 17TH INTERNATIONAL SUMMER SCHOOL ON VACUUM, ELECTRON, AND ION TECHNOLOGIES (VEIT 2011), 2012, 356
- [33] Channeling effects during focused-ion-beam micromachining of copper JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (04): : 1061 - 1065
- [34] Simple calculation of topography of focused-ion-beam sputtered surface Ishitani, Tohru, 1600, (28):
- [35] FOCUSED-ION-BEAM IMPLANTATION OF GA IN ELEMENTAL AND COMPOUND SEMICONDUCTORS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (01): : 19 - 26
- [36] FOCUSED-ION-BEAM CUTTER AND ATTACHER FOR MICROMACHINING AND DEVICE TRANSPLANTATION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (05): : 2633 - 2637
- [37] Focused-ion-beam fabricated charge density wave devices JOURNAL DE PHYSIQUE IV, 2002, 12 (PR9): : 103 - 108
- [38] SIMPLE CALCULATION ON TOPOGRAPHY OF FOCUSED-ION-BEAM SPUTTERED SURFACE JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (02): : L320 - L322
- [39] Implanted gallium ion concentrations of focused-ion-beam prepared cross sections JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 1907 - 1913