Roughness parameters of surfaces by atomic force microscopy

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Danish Inst of Fundamental Metrology [1 ]
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CIRP Ann Manuf Technol | / 1卷 / 517-522期
关键词：
Atomic force microscopy - Copper - Fourier transforms - Grain size and shape - Least squares approximations - Roughness measurement - Standards - Surface measurement - Textures - Three dimensional;
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