共 50 条
- [21] Microscopic optical beam induced current measurements and their applications Conference Record - IEEE Instrumentation and Measurement Technology Conference, 1994, 2 : 693 - 699
- [24] FLUORESCENCE OF ELECTRON-BEAM INDUCED CURRENT TO THE CHARACTERIZATION OF DEFECTS IN SEMICONDUCTORS CIRCUITS JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (01): : 71 - 76
- [26] Optical characterization of ion beam induced disorder in semiconductors irradiated with heavy ions DISORDERED MATERIALS - CURRENT DEVELOPMENTS -, 1996, 223 : 419 - 427