High frequency electrical characterization of BST capacitors

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作者：
Jammy, Rajarao [1 ]
Wills, Laura A. [1 ]
机构：
[1] Hewlett-Packard Lab, Palo Alto, United States
来源：
Integrated Ferroelectrics | 1997年 / 15卷 / 1 -4 pt 2期
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页码：235 / 243
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